About This Product
The PL-75 Spring Test Probe Pogo Pin is a precision-engineered miniature contact probe developed for applications requiring accurate and reliable electrical contact in compact electronic assemblies. With its slim profile and precision spring mechanism, the PL-75 series is ideal for high-density PCB testing, connector verification, semiconductor testing, and automated production environments.
Manufactured using premium beryllium copper contacts with gold-plated surfaces, the PL-75 delivers excellent electrical conductivity, low contact resistance, and long mechanical life. Multiple tip styles and a wide range of receptacle options make the PL-75 series suitable for ICT fixtures, FCT systems, ATE equipment, and custom testing applications.
| Specification | Value |
|---|
| Product Series | PL-75 |
| Probe Models | PL75-E2, PL75-B1 |
| Current Rating | 3A |
| Contact Resistance | ≤ 20 mΩ |
| Working Stroke | 4.30 mm |
| Spring Force | 120 g |
| Contact Material | Heat Treated Beryllium Copper |
| Barrel Material | Phosphor Bronze |
| Surface Finish | Gold Plated |
| Head Diameter | Ø1.30 mm |
| Plunger Diameter | Ø0.74 mm |
| Barrel Diameter | Ø1.02 mm |
| Total Length | 33.35 mm |
| Mechanical Life | 100,000+ Cycles |
| Package Quantity | 5 Pcs |
Key Features
✔ Compact Miniature Design
✔ Gold-Plated Contact Surface
✔ Low Contact Resistance
✔ Precision Spring Mechanism
✔ High Mechanical Durability
✔ Multiple Tip Style Options
✔ Standard & Wire Receptacle Compatibility
✔ Ideal for ICT, FCT & ATE Applications
Applications
- PCB Testing
- In-Circuit Testing (ICT)
- Functional Testing (FCT)
- Automated Test Equipment (ATE)
- Semiconductor Testing
- IC Programming Fixtures
- Connector Testing
- Mobile Device Testing
- Production Line Inspection
- Electronic Quality Control
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