About This Product
The CKS-075 Series Spring Test Probe is engineered for high-precision electrical testing where stable contact, low resistance, and long service life are essential. Manufactured with premium beryllium copper contacts and gold-plated surfaces, the CKS-075 series delivers consistent performance in high-density PCB testing and production environments.
The series supports multiple interchangeable tip styles and a complete range of standard and wire-type receptacles, making it suitable for ICT fixtures, functional testing (FCT), automated test equipment (ATE), connector testing, semiconductor inspection, and electronic manufacturing. The CKS-075 series features a 33.1 mm overall length, 1.02 mm barrel diameter, 6.35 mm maximum stroke, and a recommended 4.3 mm working stroke. Typical versions are rated for 3–4 A with ≤20 mΩ contact resistance depending on the tip configuration.
| Specification | Value |
|---|---|
| Product Series | CKS-075 |
| Probe Models | RL75-E2, RL75-B1 |
| Current Rating | 3A |
| Contact Resistance | ≤ 20 mΩ |
| Maximum Stroke | 6.35 mm |
| Recommended Working Stroke | 4.30 mm |
| Spring Force | 2 N (Approx.) |
| Contact Material | Heat Treated Beryllium Copper |
| Barrel Material | Phosphor Bronze |
| Surface Finish | Gold Plated |
| Head Diameter | Ø1.30 mm |
| Plunger Diameter | Ø0.64 mm |
| Barrel Diameter | Ø1.02 mm |
| Total Length | 33.10 mm |
| Mechanical Life | 100,000+ Cycles |
| Package Quantity | 5 Pcs |
Key Features
✔ Precision Spring-Loaded Contact
✔ Gold-Plated Contact Surface
✔ Low Contact Resistance
✔ High Mechanical Durability
✔ Stable Electrical Performance
✔ Multiple Tip Style Options
✔ Standard & Wire-Type Receptacle Compatibility
✔ Ideal for ICT, FCT & ATE Applications
Applications
- PCB Testing
- In-Circuit Testing (ICT)
- Functional Testing (FCT)
- Automated Test Equipment (ATE)
- Semiconductor Testing
- Connector Testing
- IC Programming Fixtures
- Electronics Manufacturing
- Production Line Inspection
- Quality Control Systems
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