The CKS-075 Series Spring Test Probe is engineered for high-precision electrical testing where stable contact, low resistance, and long service life are essential. Manufactured with premium beryllium copper contacts and gold-plated surfaces, the CKS-075 series delivers consistent performance in high-density PCB testing and production environments.

The series supports multiple interchangeable tip styles and a complete range of standard and wire-type receptacles, making it suitable for ICT fixtures, functional testing (FCT), automated test equipment (ATE), connector testing, semiconductor inspection, and electronic manufacturing. The CKS-075 series features a 33.1 mm overall length, 1.02 mm barrel diameter, 6.35 mm maximum stroke, and a recommended 4.3 mm working stroke. Typical versions are rated for 3–4 A with ≤20 mΩ contact resistance depending on the tip configuration.