About This Product
The CKS-50 Crown Tip Test Probe is designed for reliable electrical contact in compact testing environments. Its crown-shaped contact tip penetrates oxidation and surface contamination to ensure accurate signal transmission. Manufactured from premium materials with gold-plated contact surfaces, this probe delivers long-lasting performance and low contact resistance. Ideal for PCB testing, ICT fixtures, and electronic assembly applications.
| Specification | Value |
|---|---|
| Model | CKS-50 |
| Product Type | Crown Tip Test Probe |
| Tip Style | Crown Tip |
| Material | Brass / Beryllium Copper |
| Surface Finish | Gold Plated |
| Spring Type | Precision Spring Loaded |
| Current Rating | Up to 3A |
| Contact Resistance | ≤ 50mΩ |
| Mechanical Life | 100,000+ Cycles |
| Mounting Type | Receptacle Mount |
| Package Quantity | 50 Pcs |
Applications
- ICT Fixtures
- PCB Testing
- Functional Testing
- Electronic Manufacturing
- Automated Test Equipment
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