About This Product
The P-50 Spring Test Probe Pogo Pin is a precision-engineered miniature contact probe designed for reliable electrical testing in compact electronic assemblies. Its slim design allows accurate contact in high-density PCB layouts while maintaining excellent conductivity and long mechanical life.
Manufactured with precision-machined components and gold-plated contact surfaces, the P-50 series offers stable electrical performance, low contact resistance, and excellent durability. It supports multiple tip styles and receptacle options, making it suitable for ICT fixtures, FCT systems, connector testing, semiconductor testing, and automated production equipment.
| Specification | Value |
|---|---|
| Product Series | P-50 |
| Probe Models | PA50-E2, PA50-B |
| Current Rating | 3A |
| Contact Resistance | ≤ 50 mΩ |
| Working Stroke | 2.0 mm |
| Spring Force | 75–100 g |
| Contact Material | Heat Treated Beryllium Copper |
| Barrel Material | Phosphor Bronze |
| Surface Finish | Gold Plated |
| Head Diameter | Ø0.90 mm |
| Plunger Diameter | Ø0.48 mm |
| Barrel Diameter | Ø0.68 mm |
| Total Length | 16.55 mm |
| Mechanical Life | 100,000+ Cycles |
| Package Quantity | 5 Pcs |
Key Features
✔ Compact Miniature Design
✔ Gold-Plated Contact Surface
✔ Low Contact Resistance
✔ High Precision Spring Mechanism
✔ Long Mechanical Life
✔ Multiple Tip Configurations
✔ Standard, Crimp & Wire Receptacle Options
✔ Ideal for High-Density PCB Testing
Applications
- PCB Testing
- In-Circuit Testing (ICT)
- Functional Testing (FCT)
- Automated Test Equipment (ATE)
- Semiconductor Testing
- IC Programming Fixtures
- Connector Testing
- Mobile Device Testing
- Production Line Inspection
- Electronic Quality Control
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