The PL-50 Spring Test Probe Pogo Pin is a compact, high-precision spring-loaded contact probe engineered for applications where extremely small contact points and high-density test layouts are required. Its miniature design allows reliable electrical contact in densely populated PCBs while maintaining excellent mechanical durability and low contact resistance.

Manufactured with precision-machined components and gold-plated contact surfaces, the PL-50 series delivers stable electrical performance, long mechanical life, and consistent contact force. It is widely used in ICT fixtures, FCT systems, semiconductor testing, connector verification, and PCB production testing. Similar P50-class miniature probes are typically rated for 3A, feature ≤50 mΩ contact resistance, and support over 100,000 mating cycles.