About This Product
The P-75 Spring Test Probe Pogo Pin is a high-precision contact probe engineered for reliable electrical contact in PCB testing, functional testing, and automated inspection systems. Featuring gold-plated contact surfaces and precision-machined components, the P-75 series provides stable conductivity, low contact resistance, and extended service life.
Its compact design makes it ideal for high-density test fixtures where space is limited while maintaining excellent electrical and mechanical performance. Multiple tip configurations allow the probe to adapt to different testing surfaces and applications.
The P-75 series is widely used in ICT fixtures, bed-of-nails testing systems, production testing equipment, and quality control applications.
| Specification | Value |
|---|---|
| Product Series | P-75 |
| Probe Models | P75-E2, P75-B1 |
| Current Rating | 3A |
| Contact Resistance | ≤ 20 mΩ |
| Working Stroke | 2.5 mm |
| Contact Material | Beryllium Copper |
| Barrel Material | Brass |
| Surface Finish | Gold Plated |
| Plunger Diameter | Ø0.74 mm |
| Barrel Diameter | Ø1.02 mm |
| Total Length | 16.5 mm |
| Mechanical Life | 100,000+ Cycles |
| Package Quantity | 5 Pcs |
Applications
Applications
- PCB Testing
- ICT Fixtures
- Functional Testing (FCT)
- Bed-of-Nails Testing
- Automated Test Equipment (ATE)
- Electronics Manufacturing
- Connector Testing
- Quality Inspection Systems
- Production Line Testing
- Electronic Assembly Verification
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